Application No. 15/323,001
`Amendment dated August 15, 2019
`Reply to Office Action of June 3, 2019
`
`Docket No.: 096534-0014
`
`AMENDMENTS TO THE CLAIMS
`
`1. (Currently Amended) A substrate for sample analysis used for causing a binding reaction
`between an analyte and a ligand in a liquid sample, the substrate for sample analysis comprising:
`a base substrate having a rotation axis and a predetermined thickness;
`
`a is; chamber located in the base substrate and configured to hold a liquid sample containing
`an analyte and a ligand immobilized on a surface of magnetic particles;
`
`at least one magnet arranged at a first position where the magnetic particles are captured in
`the first chamber by the magnet; and
`
`a balancer arranged at a §_e_co_n_d_ position where, when the at least one magnet is attached, a
`3—..—_
`center of gravity of the substrate generally coincide with the rotation axis wherein
`
`the base substrate further includes (11a second chamber at the first_p_osition1_and_(2)ithird
`
`chamber at the secondpmsition, the second chamber havipg a first_opening in a surface of the base
`
`substrate, the third chamber having a second op_enir_1g_in the surface of the base substrate,
`
`the at least one mgnet is removably inserted into the second chamber through the first
`
`opening: and
`
`the balancer is removably inserted into the third chamber throughthe second omning.
`
`2. (Currently Amended) The substrate for sample analysis according to claim 1, wherein the
`
`at—least—ene—magnet—is—presdded—at the first position is a position in the vicinity of a bottom surface of
`
`the first chamber.
`
`3. (Currently Amended) The substrate for sample analysis according to claim 1, wherein:
`
`the—aHeast—ene—magnet—isprewded—at the first position is a position in the vicinity of a wall
`
`surface of the first chamber of the base substrate; and
`
`the wall surface is a surface whose normal extends in a direction in which a centrifugal force
`
`due to rotation is exerted.
`
`4. (Currently Amended) The substrate for sample analysis according to claim 1, wherein:
`
`thewat—least—ene—magnetis—preaédedat the first position is a position in the vicinity of a wall
`
`DM_US 16l82l643-l0965340014
`
`2
`
`

`

`Application No. 15/323,001
`Amendment dated August 15, 2019
`Reply to Office Action of June 3, 2019
`
`surface of the first chamber of the base substrate; and
`
`Docket No: 096534-0014
`
`the wall surface is a surface on one side where the liquid sample is supported against a
`
`centrifugal force due to rotation.
`
`5—7. (Cancelled)
`
`8. (Currently Amended) The substrate for sample analysis according to claim _1_ [[6]], wherein
`
`WWWene—magnet—attaehed—teflae—base—subm the at least one magnet is projecting from
`
`the upper surface of the base substrate when the at least one magnet is being fully inserted into the
`second chamber.
`
`9. (Currently Amended) The substrate for sample analysis according to claim 1 [[5]], wherein:
`
`the at least one magnet is provided in a magnet unit; and
`
`the at least one magnet is attaehedvldetaehed inserted/extracted to/from the second chamber
`
`base-substrate as the magnet unit is attae—hedvldetaehed inserted/extracted to/from the base substrate.
`
`10. (Currently Amended) The substrate for sample analysis according to claim 9, wherein
`
`the magnet unit is attached at the lower surface so as to be detachable off the lower surface1
`
`ml
`
`the at least one magnet is removably inserted into the second chamber when the magnet unit
`
`is attached to the surface.
`
`11. (Currently Amended) The substrate for sample analysis according to claim 9, wherein
`
` -
`
`the first
`
`position is a position in the vicinity of the first chamber.
`
`12. (Cancelled)
`
`13. (Previously presented) The substrate for sample analysis according to claim 1, wherein
`
`DM-US 161821643~l.096534.0014
`
`3
`
`

`

`Application No. 15/323,001
`Amendment dated August 15, 2019
`Reply to Ofiice Action of June 3, 2019
`
`the at least one magnet is a plurality of magnets.
`
`14. (Cancelled).
`
`Docket No.: 096534—0014
`
`15. (Previously presented) The substrate for sample analysis according to claim 1, wherein
`
`the balancer is a non~magnet.
`
`16. (Previously Presented) The substrate for sample analysis according to claim 1, wherein
`
`the balancer is provided fixedly on the base substrate or detachably attached to the base
`
`substrate; and
`
`the at least one magnet is provided fixedly or detachably attached to the base substrate.
`
`17. (Currently Amended) The substrate for sample analysis according to claim 1, wherein the
`
`at least one magnet and the balancer ears—be are physically distinguishable distinguished from each
`other.
`
`18. (Previously Presented) A sample analysis device capable of rotating the substrate for
`
`sample analysis according to claim 1, the sample analysis device comprising:
`
`a motor that rotates the substrate for sample analysis;
`
`a driver circuit that drives the motor; and
`
`a detection mechanism that detects whether or not the at least one magnet is attached by using
`
`at least one of a weight of the substrate for sample analysis, a magnetic characteristic thereof, an
`
`optical characteristic thereof, a current value or a voltage value in accordance with a rotational load
`
`thereof, a rotational acceleration thereof and a steady rotation speed thereof.
`
`19.
`
`(Previously presented) The sample analysis device according to claim 18,
`
`further
`
`comprising a signal generation circuit that generates a signal notifying of a detection result when the
`
`detection mechanism detects that the at least one magnet is not attached.
`
`DMMUS 161821643-10965340014
`
`

`

`Application No. 15/323,001
`Amendment dated August 15, 2019
`Reply to Office Action of June 3, 2019
`
`Docket No: 096534-0014
`
`20. (Original) The sample analysis device according to claim 19, wherein the signal generation
`
`circuit generates a signal for outputting a sound, light or an image.
`
`DMMUS 16182l643-l.09653410014
`
`