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`Docket No.: P200896US00
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`REMARKS
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`By this Amendment, claims 1-8 are pending. Applicant acknowledges with appreciation
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`the indication of allowability of claim 7 at page 8 of the Office Action. A new dependent claim
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`8 is added. Support is detailed below.
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`Applicant’s Response to the Claim Rejections under 35 U.S.C.§103
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`Claims 1-3 are rejected under 35 U.S.C. § 103 as being unpatentable over U.S.
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`Patent Application Publication Number 2016/0079410 Al to Yasumotoet al., “Yasumoto”,
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`in view of U.S. Patent Application Publication Number 2018/0026099 Al to Miyamotoetal.,
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`“Miyamoto”.
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`Claims 1 and 5 are rejected under 35 U.S.C. § 103 as being unpatentable over U.S.
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`Patent Application Publication Number 2016/0079410 Al to Yasumotoet al., “Yasumoto”,
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`in view of U.S. Patent Application Publication Number 2017/0250274 Al to Nakayamaet
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`al., “Nakayama”.
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`Since applicant’s remarks below similarly apply to both of the above rejections, they are
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`addressed concurrently for the sake of clarity and brevity.
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`In response thereto, applicant respectfully submits that the claims as now presented are
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`not obvious over Yasumoto in view of Miyamoto for at least the reason that the combination
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`does not provide for all the aspects of the claims, nor is there any rationale prompting a skilled
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`artisan to modify the combination so as to derive the current invention. Likewise, applicant
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`respectfully submits that the claims as now presented are not obvious over Yasumoto in view of
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`Nakayamaforat least the reason that the combination does not provide forall the aspects of the
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`claims, nor is there any rationale prompting a skilled artisan to modify the combination so as to
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`Application No.: 17/026,849
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`Docket No.: P200896US00
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`derive the current invention.
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`Specifically, both Yasumoto in view of Miyamoto and Yasumoto in view of Nakayamaat
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`least fail to provide for the aspects of parent claim 1 as to “a third opening at an outermost edge
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`part in a plan view of the substrate, the third opening penetrating through the electron supply
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`layer and the electron transport layer to the second nitride semiconductor layer; and a potential
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`fixing electrode provided in the third opening, the potential fixing electrode being connected to
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`the second nitride semiconductor layer and in contact with neither the electron transport layer nor
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`the electron supply layer.”
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`Per page 2 bridging page 4 and per page 5 bridging page 6 of the Office Action, the
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`rejections regarding base claim 1 primarily rely on Yasumoto. The rejections acknowledge that
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`Yasumotofails to teach “a third opening at an outermost edge part in a plan view ofthe substrate,
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`the third opening penetrating through the electron supply layer and the electron transport layer to
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`the second nitride semiconductor layer; and a potential fixing electrode provided in the third
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`opening, the potential fixing electrode being connected to the second nitride semiconductor layer
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`and in contact with neither the electron transport layer nor the electron supply layer” required by
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`instant claim 1. The secondary references, Miyamoto and Nakayama, are cited as individually
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`fulfilling these missing aspects.
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`In response, applicant respectfully submits that a skilled artisan would not have been
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`motivated to combine Yasumoto with Miyamoto/Nakayama due to a fundamental structural
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`difference between the primary and secondary references.
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`Specifically, related to the third opening the potential fixing electrode of instant claim 1
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`which are missing in Yasumoto, the current rejection cites to Miyamoto as disclosing “a third
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`opening (VIA)” and “a potential fixing electrode (voltage clamp 4E, ¥ [0082],[0083]),” and to
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`Application No.: 17/026,849
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`Docket No.: P200896US00
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`Nakayamaas disclosing “a third opening (filled with ISO and VIA)” and “a potential fixing
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`electrode (VIA, 4 [0080],[0081]).”
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`Miyamoto per FIG.
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`1
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`thereof discloses a horizontal FET structure—as opposed to a
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`vertical FET structure disclosed in primary reference Yasumoto—wherein the via hole VIA and
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`the fourth electrode 4E are provided to the outermost edge part, with the fourth electrode 4E
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`connected to the voltage clamp layer 2S. Miyamoto per paragraph [0114] thereof teaches
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`operation of its semiconductor device, in which “[w]hen a DC voltage is externally applied to the
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`fourth electrode 4E,
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`the second nitride semiconductor layer (voltage clamp layer) 2S has a
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`voltage equal to that of the fourth electrode 4E, and thus serves as a back gate,” allowing for
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`control of the threshold of the transistor. As such, the voltage clamp layer 2S and the fourth
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`electrode 4E of Miyamoto are provided to serve as a back gate to control the horizontal FET’s
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`threshold value.
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`Furthermore, since Miyamoto’s horizontal FET structure requires voltage
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`application horizontally rather than vertically, the reference device does not involve concerns
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`regarding a leakage current flowing vertically at the end part, the specific problem identified in
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`the present application.
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`Nakayamarelates to a horizontal FET structure analogous to that of Miyamoto. Per
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`paragraph [0080] of Nakayama, “[by] providing the n-type semiconductor region CDn and the
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`coupling portion VIA and fixing the n-type semiconductor region CDn to a predetermined
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`potential (e.g., 0 V or a negative potential), it is possible to reduce variations in properties such
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`as threshold potential and ON resistance.” As such, although Nakayama does disclose a coupling
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`portion VIA, said coupling portion VIA is not for preventing leakage current.
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`In addition, the
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`coupling portion VIA is connected to n-type semiconductor region CDn, whichis different from
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`the structure of the present application.
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`Application No.: 17/026,849
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`Docket No.: P200896US00
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`Accordingly, given the intended purpose of the alleged potential fixing electrode, 1.¢.,
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`serving as a back gate to control the horizontal FET’s threshold value, a skilled artisan would not
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`have been motivated to apply the arrangement of Miyamoto/Nakayama to improve Yasumoto’s
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`vertical FET device. Further, the art of record is silent as to beneficial effects of the potential
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`fixing electrode, such as, e.g., the capability to prevent leakage current flowing vertically, as
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`disclosed in the present application. As such, there would have been norationale prompting a
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`skilled artisan to modify Yasumoto’s device by incorporating the alleged third opening and
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`potential fixing electrode as taught in Miyamoto/Nakayama, and there would have been no
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`reasonable expectation of success in performing the suggested modification where so doing
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`would contradict the operational principle whereby the reference device is designed to function.
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`Wherefore, applicant respectfully submits that claim 1 as now presented, as well as its
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`respective dependent claims are not obvious over Yasumoto in view of Miyamoto. Also,
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`applicant respectfully submits that claim 1 as now presented, as well as its respective dependent
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`claims are not obvious over Yasumoto in view of Nakayama.
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`Claim 4 is rejected under 35 U.S.C. § 103 as being unpatentable over U.S. Patent
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`Application Publication Number 2016/0079410 Al to Yasumotoet al., “Yasumoto”, in view
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`of U.S. Patent Application Publication Number 2018/0026099 Al
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`to Miyamoto et al.,
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`“Miyamoto”, further in view of U.S. Patent Number 5,977,609 to Soderbarg et al.,
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`“Soderbarg”.
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`Claim 6 is rejected under 35 U.S.C. § 103 as being unpatentable over U.S. Patent
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`Application Publication Number 2016/0079410 Al to Yasumotoet al., “Yasumoto”, in view
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`of U.S. Patent Application Publication Number 2018/0026099 Al
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`to Miyamoto et al.,
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`Application No.: 17/026,849
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`Docket No.: P200896US00
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`“Miyamoto”, as applied to claim 1 above, and further in view of U.S. Patent Application
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`Publication Number 2012/0153300 A1 to Lidowet al., “Lidow”.
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`Applicant respectfully submits that by addressing the rejection of parent claim 1 as
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`detailed above, likewise the current rejections of claims 4 and 6 are addressed by nature of their
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`dependency.
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`New Claim 8
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`New dependentclaim 8 recites that “a bottom part of the second opening and a bottom
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`part of the third opening are at a same height.” Support may be foundin the original disclosure,
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`for example, at FIGs. 2, 4 and10-12 and accompanying text. Aside from its dependency from
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`instant claim 1, applicant respectfully submits that new claim 8 is on its own merit distinguished
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`from the art of record.
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`In view of the foregoing amendments and accompanying remarks, it is submitted that all
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`pending claims are in condition for allowance. A prompt and favorable reconsideration of the
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`rejection and an indication of allowability of all pending claims are earnestly solicited.
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`If the Examiner believes that there are issues remaining to be resolved in this application,
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`the Examineris invited to contact the undersigned attorney at the telephone number indicated
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`below to arrange for an interview to expedite and complete prosecution ofthis case.
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`Application No.: 17/026,849
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`Docket No.: P200896US00
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`If this paper is not timely filed, Applicants respectfully petition for an appropriate
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`extension of time. The fees for such an extension or any other fees that may be due with respect
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`to this paper may be charged to Deposit Account No. 50-2866.
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`Respectfully submitted,
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`WHDA, LLP
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`/Michael J. Caridi/
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`MichaelJ. Caridi
`Attorney for Applicants
`Registration No. 56,171
`Telephone: 703-827-3800
`Facsimile: 571-395-8753
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`MJC/fo
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`10
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