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`1.(Amended) An elastic wave device comprising:
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`a piezoelectric substrate formed of lithium niobate;
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`an IDT electrode disposed on the piezoelectric substrate;
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`a first dielectric layer disposed on the piezoelectric substrate, the
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`first dielectric layer covering the IDT electrode; and
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`a second dielectric layer disposed over the first dielectric layer, the
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`second dielectric layer propagating a transverse wave faster than a speed
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`10
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`of a transverse wave propagating on the first dielectric layer;
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`wherein
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`a film thickness of the second dielectric layer is more than 0.8
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`times as large as wavelength k of SH wave excited by the IDT electrode;
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`a cut angle of the piezoelectric substrate is indicated by Euler
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`15
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`angles (¢, 9, and (p), and
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`correction functions F1 and F2 are3
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`[Equation 1]
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`g—oz
`fig—0.09
`0.12—0.08g (¢)+ 0.4—0.2
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`F1=———— 1 ———h1
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`Egg)
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`[Equation 2]
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`[2—4.2
`“Th—0.09
`0.12—0.08 g (¢)+ 0.4—0.2
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`F2 = —— 2
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`112
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`(‘15)
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`25
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`
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`whereas h is a film thickness of the IDT electrode, a is a ratio of a
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`density of the IDT electrode to a density of copper, and H is a film
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`thickness of the first dielectric layer; and
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`5
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`10
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`the g1 (¢), the g2 (¢), the hl ((25), and the h2 (¢) are:
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`[Equation 3]
`g1(¢) = 0.0352¢2 — 0.0852¢ — 0.3795
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`[Equation 4]
`g2(¢) = 0.0589¢2 — 0.4089¢ + 0.7821
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`[Equation 5]
`h1(¢) = 0.0161¢2 — 0.1175¢ + 0.6964
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`[Equation 2]
`h2(¢)= —0.0339¢2 +0.5496¢—1.3464;
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`the cut angle of the piezoelectric substrate satisfiesi
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`15
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`1) When -77.5° s 0 < -72.5°,
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`-0.5° S ¢ < 0.5° and -2.2° + F2 5 (p < -1.4° + F1
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`or
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`I
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`0.5° : ¢ < 1.5° and -2.4° + F2 5 (p < -O.8° + F1
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`or
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`20
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`1.5° S ¢ < 2.5° and -2.6° + F2 S (p < "02° + F1
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`or
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`25° 5 (b < 3.5° and -2.8° + F2 5 (p < 03° + F1
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`or
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`3.5° S (/5 < 4.5° and -3.1° + F2 5 (p < O.8° + F1
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`25
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`01'
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`
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`4.5° S (/5 < 5.5° and 33° + F2 5 (p < 1.3° + F1
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`ii) When -72.5° s e < -67.5°,
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`-O.5° 5 ¢ < 0.5° and 25° + F2 5 (p < -1.7° + F1
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`01‘
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`0.5° S ¢ < 1.5° and -2.6° + F2 5 (p < 'O.9° + F1
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`01'
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`1.5° 5 ¢ < 2.5° and 27° + F2 5 (p < '0.1° + F1
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`01‘
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`25° S ¢ < 3.5° and 27° + F2 5 (p < O.7° + F1
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`10
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`01‘
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`3.5° 5 ¢ < 4.5° and 29° + F2 5 (p < 1.3° + F1
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`01'
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`45°: ¢ <5.5° and -3°+F2£cp<2°+F1
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`iii) When ~67.5° S 9 < -62.5°,
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`15
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`-O.5° 5 ¢ < 0.5° and -3.2° + F2 5 (p < -2.2° + F1
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`01'
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`0.5° 5 ¢ < 1.5° and -3° + F2 _<_ (p < -0.9° + F1
`01'
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`1.5° 5 ¢ < 2.5° and 27° + F2 5 (p < 0.4° + F1
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`20
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`01'
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`25° 5 975 < 3.5° and -2.5° + F2 5 (p < 1.5° + F1
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`01'
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`3.5° 5 ¢ < 4.5° and -2.4° + F2 5 (p < 26° + F1
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`01'
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`25
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`4.5° 5 ¢ < 5.5° and -2.4° + F2 5 (p < 33° + F1
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`
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`iv) When ~62.5° : e < -57.5°,
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`'O.5° S ¢ < 0.5° and -5.2° + F2 S (p < '4.1° + F1
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`01‘
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`O.5° 5 ¢ < 1.5° and -4° + F2 S (p < '0.8° + F1
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`01'
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`1.5° 5 ¢ < 25° and -2.8° +F2 s (p < 2.1° + F1
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`01'
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`25° 3 ¢ < 3.5° and -1.8° + F2 5 (p < 4.1° + F1
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`01‘
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`3.5° 5 ¢ < 4.5° and -1.1° + F2 5 (p < 5.5° + F1
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`01'
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`4.5° 5 ¢ < 5.5° and -0.9° + F2 5 (p < 62° + F1.
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`2. The elastic wave device of claim 1,
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`15
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`wherein
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`the cut angle of the piezoelectric substrate is a value that makes
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`an absolute value of a power flow angle of the SH wave excited by the IDT
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`electrode to be less than 03°, and makes an absolute value of a power
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`flow angle of the Stoneley wave excited by the IDT electrode to be not less
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`20
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`than 03°.
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`3. (Cancelled)
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`4. (Cancelled)
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`25
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`5. (Cancelled)
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`6. Electronic equipment comprisingi
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`the elastic wave device of claim 1; and
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`a semiconductor integrated circuit device connected to the elastic
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`wave device.
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